研究目的
To modify b-Ga2O3 by incorporating Sc to form ternary (ScGa)2O3 alloys for developing high-performance UV photodetectors with a low dark current and high response speed.
研究成果
The Sc-alloying strategy is effective in widening the bandgap while reducing the intrinsic carriers and oxygen vacancies in the (ScGa)2O3 alloy, leading to the development of high-performance UV photodetectors with a low dark current and high response speed.
研究不足
The technical and application constraints of the experiments include the degraded detectivity resulted from decreased photoconductive gain due to the much reduced oxygen vacancies with further increasing Sc content.
1:Experimental Design and Method Selection:
High-quality ((cid:2)201)-oriented SGO alloy ?lms were prepared on c-sapphire substrates using PLD.
2:Sample Selection and Data Sources:
b-Ga2O3 and SGO thin ?lms (~150 nm thickness) were deposited onto c-sapphire substrates.
3:List of Experimental Equipment and Materials:
A Bruker D8 Discover X-ray diffractometer, QUANTAX EDS, FE-SEM, Solver Nano NT-MDT AFM, Shimadzu UV3600 Plus UVeViseNIR spectrophotometer, Keithley 2635 Source Meter, and a 150 W low-pressure UV-enhanced xenon lamp were used.
4:Experimental Procedures and Operational Workflow:
The ?lms were deposited at a substrate temperature of 700 (cid:3)C and oxygen pressure of 4 Pa. After ?lm deposition, parallel Au electrodes were grown on the ?lms.
5:Data Analysis Methods:
The crystal structures, compositions, surface morphology, optical properties, and photoelectric characteristics were analyzed.
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Bruker D8 Discover X-ray diffractometer
D8 Discover
Bruker
Determining crystal structures of the SGO and b-Ga2O3 ?lms
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QUANTAX EDS
QUANTAX EDS
Bruker
Examining compositions of the SGO alloy ceramics and ?lms
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FE-SEM
Sigma 500
Zeiss
Field-emission scanning electron microscope
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UV3600 Plus UVeViseNIR spectrophotometer
UV3600 Plus
Shimadzu
Measuring the optical properties
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Keithley 2635 Source Meter
2635
Keithley
Measuring the photoelectric characteristics of PDs
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AFM
Solver Nano NT-MDT
NT-MDT
Characterizing the surface morphology and roughness of the ?lms
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UV-enhanced xenon lamp
Providing UV illumination for photoelectric characteristics measurement
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