研究目的
To quantitatively characterize and evaluate the residual stress in solar cells induced by massive micro-particle impact, in order to optimize the structure design and enhance its reliability.
研究成果
The developed residual stress analysis method based on Raman spectroscopy quantitatively shows that micro-particle impact induces significant residual stresses in PV cells, up to hundreds of MPa, which can degrade performance. Various damage patterns are observed, providing insights into the damage mechanisms and suggesting directions for improving PV cell design and protection.
研究不足
The study focuses on the impact of massive micro-particles, which may not fully represent all environmental stresses PV cells face. The penetration depth of micro-Raman spectroscopy is limited, and the study suggests combining it with synchrotron micro-XRD for full-field stress distribution.
1：Experimental Design and Method Selection:
The study employs a novel method based on backscattering Raman spectroscopy to analyze residual stress in PV cells after laser-driven micro-particle impact. Optical microscopy (OM) and Scanning Electron Microscopy (SEM) are used to investigate the damage behavior.
2：Sample Selection and Data Sources:
Triple-junction thin film GaInP/GaInAs/Ge PV cells with Ge substrate are used. The impact experiments simulate environmental effects with micro-particles mimicking dust.
3：List of Experimental Equipment and Materials:
A Q-switch high power Nd:YAG pulsed laser, Renishaw inVia plus Raman microscope system, and standard light source for performance tests.
4：Experimental Procedures and Operational Workflow:
Laser-driven micro-particles impact experiments are performed, followed by Raman spectroscopy measurements and damage characterization using OM and SEM.
5：Data Analysis Methods:
The phonon deformation potentials and Gr¨uenisen constants are used to translate Raman peak shifts into local strain and stress.
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