研究目的
Investigating a novel approach for electron emission utilizing a diamond pin-diode for applications in telecommunications and radar.
研究成果
The research successfully demonstrated a novel approach for electron emission using diamond pin-diodes, with significant enhancement in electron emission observed with the insertion of a nano-structured carbon contact layer. This indicates the potential for diamond pin-diodes in efficient electron sources for telecommunications and radar applications.
研究不足
The study is limited by the specific conditions under which the diamond pin-diodes were prepared and characterized, including the use of high-pressure, high-temperature substrates and the need for a pure hydrogen plasma treatment to achieve negative electron affinity properties.
1:Experimental Design and Method Selection:
The study utilized a diamond pin-diode structure grown by plasma-enhanced chemical vapor deposition (PECVD) and processed by photo-lithography.
2:Sample Selection and Data Sources:
High-pressure, high-temperature (HTHP) type IIb substrates with (111) surface orientation were used.
3:List of Experimental Equipment and Materials:
Dedicated CVD reactors, photo-lithography equipment, aluminum hard mask, Ti/Pt/Au metallurgy for electrical contacts.
4:Experimental Procedures and Operational Workflow:
The diamond pin diodes were prepared, an intrinsic diamond layer was deposited, followed by an n-type phosphorus doped diamond layer, and a final contact layer of nitrogen incorporated nano-structured carbon. The devices were then processed through lithography and treated in a pure hydrogen plasma.
5:Data Analysis Methods:
Electrical characterization was performed using a 2-point probe setup, and electron emission was measured under forward bias.
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