研究目的
To develop a new solid state rectifier compatible with CMOS integrated circuits for direct conversion of terahertz radiation at room temperature, focusing on creating a rectenna structure for imaging and spectroscopy applications.
研究成果
The proposed solid state rectifier, integrated as a rectenna with a MOS-FET transistor, efficiently converts terahertz radiation to DC current at room temperature through self-mixing effects in plasma waves. TCAD simulations confirm the generation of rectified potential, and the structure is compatible with CMOS technology, offering advantages in cost and integration for imaging systems. Future work should focus on experimental validation and optimization for real-world applications.
研究不足
The study relies on simulations rather than experimental validation; potential limitations include simplifications in boundary conditions and model assumptions, such as the abrupt edge depletion approximation and small signal approximation. The rectifier's performance may be affected by practical fabrication constraints in CMOS technology.
1:Experimental Design and Method Selection:
The study involves designing a rectenna structure combining an antenna with a rectifying device, using theoretical modeling and TCAD simulations to analyze self-mixing effects and plasma waves in a MOS-FET transistor.
2:Sample Selection and Data Sources:
Simulations are based on standard MOS structures with specified doping levels (e.g., substrate doped with 10^18 cm-3 acceptors) and applied RF voltages (e.g., 100 μV).
3:List of Experimental Equipment and Materials:
Synopsys Sentaurus TCAD software for numerical simulations, CMOS technology components including metal layers, oxide, and semiconductor substrates.
4:Experimental Procedures and Operational Workflow:
Harmonic balance simulations are performed on the first 5 harmonics using hydrodynamic models to study DC electrostatic potential generation and rectification effects.
5:Data Analysis Methods:
Analysis focuses on the spatial distribution of self-mixing potential, dependence on gate voltage and frequency, and comparison with theoretical models.
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