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A review of the most recent progresses of state-of-art gallium oxide power devices

DOI:10.1088/1674-4926/40/1/011803 期刊:Journal of Semiconductors 出版年份:2019 更新时间:2025-09-23 15:22:29
摘要: Until very recently, gallium oxide (Ga2O3) has aroused more and more interests in the area of power electronics due to its ultra-wide bandgap of 4.5–4.8 eV, estimated critical field of 8 MV/cm and decent intrinsic electron mobility limit of 250 cm2/(V·s), yielding a high Baliga’s figures-of-merit (FOM) of more than 3000, which is several times higher than GaN and SiC. In addition to its excellent material properties, potential low-cost and large size substrate through melt-grown methodology also endows β-Ga2O3 more potential for future low-cost power devices. This article focuses on reviewing the most recent advances of β-Ga2O3 based power devices. It will be starting with a brief introduction to the material properties of β-Ga2O3 and then the growth techniques of its native substrate, followed by the thin film epitaxial growth. The performance of state-of-art β-Ga2O3 devices, including diodes and FETs are fully discussed and compared. Finally, potential solutions to the challenges of β-Ga2O3 are also discussed and explored.
作者: Hong Zhou,Jincheng Zhang,Chunfu Zhang,Qian Feng,Shenglei Zhao,Peijun Ma,Yue Hao
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Reviewing the most recent advances of β-Ga2O3 based power devices, including material properties, growth techniques, device performance, and potential solutions to challenges.

Significant progresses have been achieved with remarkable power device performances even at this premature development stage, such as BV more than 3 kV of lateral Schottky Rectifiers, high current density 1.5/1 A/mm of D/E-modes FETs, BV of 1.8 kV for field-plated lateral MOSFET and fT/fmax of 5.1/17.1 GHz, respectively. In addition to device performance, sufficient low defect density less than 103 cm?2 of melt-grown native substrate and very smooth surface with RMS roughness less than 0.5 nm of epitaxial β-Ga2O3 thin film on its native substrate have all been demonstrated. However, some open questions about how to realize p-type β-Ga2O3 and how to resolve the low thermal conductivity issue are yet to be established. Once resolving those aforementioned issues, the bright future of β-Ga2O3 devices as power electronic products are definitely coming soon.

The paper is a review and does not conduct new experiments, so it does not have experimental limitations. However, it discusses challenges such as p-type doping difficulties and low thermal conductivity in β-Ga2O3 devices.

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