研究目的
Investigating the effects of introducing a small molecular material, tetratetracontane (TTC), at the fullerene (C60)/perovskite interface of planar p-i-n perovskite solar cells (PVSCs) to improve efficiency and stability.
研究成果
The insertion of TTC as an interlayer in planar p-i-n PVSCs significantly improves efficiency and stability by reducing interface trap density and enhancing electron extraction. The hydrophobic nature of TTC also protects the perovskite film from water damage, leading to better long-term stability.
研究不足
The study focuses on the stability and efficiency improvements with TTC but does not extensively explore the scalability of the fabrication process or the long-term stability under varying environmental conditions beyond 200 hours.
1:Experimental Design and Method Selection
The study involved the introduction of TTC at the C60/perovskite interface to reduce interfacial traps, suppress electron recombination, and facilitate electron extraction. The methodology included the fabrication of PVSCs with and without TTC layers to compare their performance and stability.
2:Sample Selection and Data Sources
Perovskite precursor solutions were prepared using specific materials, and devices were fabricated with a structure of ITO/PTAA:F4TCNQ/CH3NH3PbI3/TTC/C60/BCP/Ag. Control devices without TTC were also prepared for comparison.
3:List of Experimental Equipment and Materials
Materials included PbI2, methylammonium iodide (MAI), PTAA, DMF, DMSO, F4-TCNQ, C60, BCP, and Ag. Equipment used included a Keithley 2400 Source Meter, Newport Oriel IPCE measurement kit, ZEISS Sigma FE-SEM, Rigaku Ultima IV diffractometer, and UV-1700 spectrometer.
4:Experimental Procedures and Operational Workflow
The fabrication process involved cleaning ITO substrates, spin-coating PTAA:F4-TCNQ and perovskite layers, depositing TTC and C60 layers by thermal evaporation, and finally evaporating Ag electrodes. Characterization included J-V measurements, IPCE, SEM, XRD, and UV-Vis absorption spectra.
5:Data Analysis Methods
Data analysis involved comparing the photovoltaic parameters (Voc, Jsc, FF, PCE) of devices with and without TTC, analyzing SEM and AFM images for surface morphology, and evaluating TRPL and PL spectra for charge dynamics.
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ZEISS Sigma field-emission scanning electron microscopy
Sigma
ZEISS
Taking scanning electron microscopy (SEM) images.
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Rigaku Ultima IV diffractometer
Ultima IV
Rigaku
Recording the X-ray diffraction (XRD) patterns using Cu Kα radiation.
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Keithley 2400 Source Meter
2400
Keithley
Recording the device photocurrent under AM1.5 illumination condition.
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Newport Oriel IPCE measurement kit
Oriel IPCE
Newport
Measuring the incident photon-to-electron conversion efficiency (IPCE).
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UV-1700 spectrometer
UV-1700
Measuring the UV–Vis absorption spectra.
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