研究目的
Investigating the effect of rapid oxidation temperature on sputtered nickel films to act as a hole transport layer for high-performance perovskite solar cells.
研究成果
The study concludes that NiO films oxidized at 450 °C exhibit the highest performance as hole transport layers in perovskite solar cells, achieving a power conversion efficiency of 12.05%. This is attributed to optimal carrier concentration and mobility at this oxidation temperature.
研究不足
The rapid oxidation process may lead to incomplete oxidation and the formation of defects, affecting the uniformity and electrical properties of the NiO films. The study is limited to a specific range of oxidation temperatures and film thicknesses.
1：Experimental Design and Method Selection
The study involved the rapid oxidation of sputtered nickel films at different temperatures to act as hole transport layers in perovskite solar cells. DC Hall measurement and photoluminescence spectroscopy were used to assess charge mobility and extraction.
2：Sample Selection and Data Sources
Nickel films with a thickness of about 100 nm were sputtered onto FTO substrates and oxidized at temperatures between 350 and 650 °C.
3：List of Experimental Equipment and Materials
DC sputtering system (Hummer 8.1), muffle furnace for oxidation, UV-Vis spectrophotometer (Evolution 600), fluorescence spectrophotometer (Perkin Elmer LS-55), X-ray diffractometer (X-ray 7000 Shimadzu), SEM (JEOL JSM-6360 LA), Hall Effect Measurement System (HMS-5000 Ecopia), KEITHLEY series 2635A system source meter.
4：Experimental Procedures and Operational Workflow
Nickel films were sputtered onto cleaned FTO substrates, oxidized at various temperatures, and characterized for their optical, structural, and electrical properties. Perovskite solar cells were fabricated using these films as HTLs, and their performance was evaluated.
5：Data Analysis Methods
Optical properties were analyzed using UV-Vis spectroscopy, structural properties via XRD, morphological properties via SEM, and electrical properties via Hall measurements. Solar cell performance was assessed using current-voltage characteristics.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
System source meter
2635A
KEITHLEY
Used for current-voltage characteristics measurements under both dark and illumination conditions.
-
UV-Vis spectrophotometer
Evolution 600
Thermo Scientific
Used for measuring the transmission and absorption spectra of NiO thin films.
-
Fluorescence spectrophotometer
LS-55
Perkin Elmer
Used for photoluminescence measurements.
-
X-ray diffractometer
X-ray 7000
Shimadzu
Used for studying the crystallinity of the prepared films.
-
SEM
JSM-6360 LA
JEOL
Used for investigating the surface morphology of different films.
-
DC sputtering system
Hummer 8.1
Used for sputtering nickel films onto substrates.
-
Hall Effect Measurement System
HMS-5000
Ecopia
Used to measure the conductivity, carrier mobility and carrier concentration of prepared NiO thin films.
-
登录查看剩余5件设备及参数对照表
查看全部
