研究目的
Investigating the effects of scanning atmospheric-pressure plasma jet (APPJ) treatment on nickel oxide (NiO) for fabricating p–i–n structure perovskite solar cells (PSCs) to improve their performance.
研究成果
APPJ treatment on NiO with a peak temperature of 500 °C improves the performance of p–i–n PSCs by enhancing light scattering, improving wettability, and facilitating more complete conversion of the liquid precursor into NiO. This leads to increased PCE, Jsc, and F.F., demonstrating the potential of APPJ treatment for optimizing PSC performance.
研究不足
The study focuses on the effects of APPJ treatment on NiO for PSCs but does not explore the scalability of the process for industrial applications or the long-term stability of the treated PSCs.
1:Experimental Design and Method Selection:
The study employed a scan-mode nitrogen DC-pulse APPJ to treat NiO for PSCs, with the peak substrate temperature set to 500 °C. The optical transmittance, haze spectra, surface morphology, chemical bonding configuration, wettability, conductivity, and electrochemical properties of scanning APPJ-treated NiO were characterized.
2:Sample Selection and Data Sources:
FTO glass substrates were used, treated with NiO films prepared from a precursor solution of nickel acetate and ethanolamine in ethanol. The NiO films were then treated with APPJ in scanning mode.
3:List of Experimental Equipment and Materials:
Equipment included an APPJ system, UV-vis spectrophotometer, SEM, AFM, XPS, contact angle goniometer, and electrochemical workstation. Materials included nickel acetate, ethanolamine, ethanol, FTO glass, and CH3NH3PbI
4:Experimental Procedures and Operational Workflow:
The NiO film was annealed and then treated by APPJ in scanning mode. The treated NiO films were characterized, and PSCs were fabricated and their performance evaluated.
5:Data Analysis Methods:
Data were analyzed using UV-vis spectroscopy, SEM, AFM, XPS, and electrochemical impedance spectroscopy to evaluate the effects of APPJ treatment on NiO and PSC performance.
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ethanolamine
99.5%
Sigma-Aldrich
Precursor for NiO film
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UV-vis spectrophotometer
V-670
JASCO
Measurement of UV-vis transmittance and reflectance
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SEM
JSM-7800Prime
JOEL
Examination of surface morphology
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AFM
BioScope Resolve
Bruker
Examination of surface morphology
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XPS
ESCALAB Xi+
Thermo Fisher Scientific
Analysis of surface chemical bonding status and elemental composition
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nickel acetate
99.998%, trace metal basis
Sigma-Aldrich
Precursor for NiO film
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FTO glass
TEC7
Substrate for NiO film deposition
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contact angle goniometer
Model 100SB
Sindatek
Measurement of water contact angle
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electrochemical workstation
PGSTAT204
Metrohm-Autolab
Electrochemical impedance spectroscopy
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