研究目的
Investigating the synthesis of highly-oriented black CsPbI3 microstructures for high-performance solar cells.
研究成果
The oriented attachment strategy enables the formation of highly-oriented quasi-single-crystalline perovskite microstructures films, essential for high-efficiency and stable thin film PSCs. The PSCs fabricated with the modified CsPbI3 light absorber showed a high-power conversion efficiency of 16.0% with excellent reproducibility and inert atmosphere stability.
研究不足
The study focuses on CsPbI3 perovskite solar cells, and the findings may not directly apply to other perovskite materials. The stability tests were conducted in an inert environment, which may not reflect real-world conditions.
1：Experimental Design and Method Selection:
The study employed an oriented attachment strategy to fabricate highly-oriented quasi-single-crystalline CsPbI3 films. Theoretical calculations and detailed in/ex situ characterizations were used to understand the process.
2：Sample Selection and Data Sources:
CsPbI3 precursor solutions with different DMF:DMSO ratios were prepared and characterized.
3：List of Experimental Equipment and Materials:
Equipment included SEM, XRD, XPS, FTIR, XAS, TEM, and solar simulators. Materials included CsI, PbI2, DMF, DMSO, and TiO
4：Experimental Procedures and Operational Workflow:
Perovskite films were deposited via spin-coating, followed by annealing. Device fabrication included TiO2 compact and mesoporous layers, perovskite layer, spiro-OMeTAD, and gold electrodes.
5：Data Analysis Methods:
Data were analyzed using various spectroscopy and microscopy techniques, including XRD, XPS, FTIR, XAS, and TEM.
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In situ FTIR spectrometer
Nicolet 6700
Thermo Fisher
Performing in situ FTIR measurements
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Focused ion beam (FIB) system
Helios Dualbeam
FEI
Preparing cross-section samples for TEM
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SRS 810 lock-in amplifier
810
Stanford Research Systems
Amplifying signals for IPCE measurements
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Surface scanning electron microscopy (SEM)
JEOL FESEM 6340F
JEOL
Investigating surface and cross-section morphologies
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UV-3600 spectrophotometer
3600
Shimadzu
Acquiring optical absorption spectra
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Edinburgh Instruments FLS980 apparatus
FLS980
Edinburgh Instruments
Performing steady-state and time-resolved photoluminescence spectra
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EPL-510 ps pulsed diode laser
EPL-510
Edinburgh
Excitation source for TRPL measurements
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Power meter
PE10BF-C
Ophir
Monitoring laser pulse intensity
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X-ray diffraction (XRD) diffractometer
D/max 2500
Rigaku
Studying crystal structure
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Keithley 2400 digital sourcemeter
2400
Keithley
Measuring current-voltage characteristics
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Spiro-OMeTAD
Merck KGaA
Hole transport material in perovskite solar cells
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Mesoporous TiO2 paste
Dyesol
Electron transport layer in perovskite solar cells
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PbI2
Tokyo Chemical Industry Co., Ltd. (TCI)
Precursor for perovskite synthesis
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F-doped SnO2 (FTO) glass substrate
TEC 14
NSG
Conductive substrate for solar cells
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Solar simulator
SAN-EI Electric XEC-301S 300W Xe Lamp JIS Class AAA
SAN-EI Electric
Simulating AM 1.5 illumination for solar cell testing
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Standard reference silicon cell
Newport
Calibrating light intensity
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Neutral density filters
Newport
Adjusting light intensity
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Oriel 300-W Xe lamp
Oriel
Light source for IPCE measurements
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Oriel Cornerstone 130 monochromator
130
Oriel
Selecting wavelengths for IPCE measurements
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Calibrated Si diode
Newport
Reference for IPCE measurements
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