1：Experimental Design and Method Selection:

The study used a standard solution casting technique to synthesize PVA films doped with yttrium nitrate. Various characterization techniques including XRD, FTIR, SEM, UV-Vis-NIR spectroscopy, dielectric measurements, and I-V characteristics were employed to analyze structural, optical, and electrical properties.

2：Sample Selection and Data Sources:

PVA powder (4N purity, polymerization degree 1700–1800) from Alfa Aesar and Yttrium (III) nitrate hexahydrate (3N purity) were used. Samples were prepared with specific weights (0.037, 0.37, 3.7, 18.5, and 37 wt%) of Y3+ ions in PVA solution.

3：037, 37, 7, 5, and 37 wt%) of Y3+ ions in PVA solution. List of Experimental Equipment and Materials:

3. List of Experimental Equipment and Materials: Equipment includes Shimadzu XRD-6000 diffractometer, Thermo Nicolet 6700 FTIR spectrometer, JSM-6360 SEM, JASCO V-570 spectrophotometer, and 4200-SCS KEITHLEY semiconductor system. Materials include PVA, Y(NO3)3·6H2O, distilled water, petri dishes.

4：Experimental Procedures and Operational Workflow:

PVA was dissolved in distilled water, stirred, and mixed with Y3+ salt. Solutions were ultrasonicated, poured into petri dishes, and evaporated at 40°C for 5 days to form films. Characterization involved XRD (10°–60° 2θ range), FTIR (500–4000 cm?1 range), SEM imaging, UV-Vis-NIR transmittance (220–900 nm), dielectric measurements (3 kHz–10 MHz), and I-V measurements.

5：Data Analysis Methods:

Data were analyzed using Gaussian fitting for XRD peaks, Tauc's formula for energy gap calculation, and slope analysis for I-V characteristics to determine nonlinear behavior.