研究目的
Investigating the impact of manganese doping in organic–inorganic perovskite semiconductors on their optoelectronic properties and device performance.
研究成果
The study concludes that low concentrations of Mn2+ doping in MAPbI3 perovskite improve device performance by enhancing VOC and FF, while higher concentrations lead to performance deterioration due to reduced crystallinity and increased grain boundaries. Multifunctional scanning probe microscopy techniques are effective in studying doping effects in perovskite materials.
研究不足
The study is limited by the detection limits of techniques like EDS and XPS for low dopant concentrations. The stability of Mn-doped devices under continuous illumination is also a limitation.
1:Experimental Design and Method Selection:
The study involved the preparation of manganese-doped perovskite films with varying Mn/Pb ratios and their characterization using various techniques including scanning probe microscopy (SKPM, C-AFM, EFM), XRD, UV-Vis absorption, PL, UPS, and EIS.
2:Sample Selection and Data Sources:
Perovskite films were prepared with Mn/Pb ratios ranging from 0% to 2%.
3:2%. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment used includes a multifunction powder X-ray diffractometer, UV/Vis/NIR spectrometer, fluorescence spectrophotometer, UPS, SEM, AFM, and electrochemical workstation. Materials include CH3NH3I, PC61BM, PEDOT:PSS, and MnCl
4:Experimental Procedures and Operational Workflow:
Films were spin-coated on substrates, annealed, and characterized. Device fabrication involved layering materials and thermal evaporation of electrodes.
5:Data Analysis Methods:
Data from various characterizations were analyzed to understand the impact of doping on film properties and device performance.
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X-ray diffractometer
Rigaku Smartlab 9 KW
Rigaku
Measuring XRD patterns of perovskite films
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UV/Vis/NIR spectrometer
LAMBDA 950
PerkinElmer
Recording absorption spectra of perovskite films
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Fluorescence spectrophotometer
FS5
Edinburgh Instruments
Recording PL and time-resolved PL spectra of perovskite films
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Transmission electron microscope
MIRA3 TESCAN
Carl ZeissAG
Characterizing perovskite films on substrates
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Focused-ion beam
FEI Helios Nanolab 600i
FEI
Performing cross-section SEM of perovskite films
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Optical microscope
IX71
Olympus
Integrating with AFM system for illumination during measurements
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Ultraviolet photoelectron spectroscopy
AXIS Ultra DLD
KRATOS Analytical
Collecting surface work functions of perovskite films
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Electrochemical workstation
Zennium
Zahner
Measuring EIS of perovskite solar cells
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Atomic force microscopy
MFP-3D-BIO AFM
Asylum Research
Performing SKPM, C-AFM, and EFM measurements on perovskite films
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Laser power meter
LP1
Measuring light intensity during AFM measurements
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