研究目的
Investigating the impact of Cu-In-Ga-S nanoparticles compactness on holes transfer of perovskite solar cells.
研究成果
The study demonstrates that tuning the spin-coating speed of CIGS films can optimize the balance between grain size and coverage ratio, leading to improved hole transfer efficiency and device performance. The optimal spin-coating speed was found to be 4000 r.p.m., resulting in a conversion efficiency of 15.16% and open-circuit voltage of 1.04 V.
研究不足
The study focuses on the impact of CIGS film compactness on device performance but does not explore the long-term stability of devices under operational conditions or the scalability of the fabrication process.
1:Experimental Design and Method Selection
The study systematically investigated the effect of CIGS film compactness on device performance using a device structure of FTO/CIGS/perovskite/PCBM/ZrAcac/Ag. The grain size and coverage ratio of CIGS films on FTO substrates were tuned by varying spin-coating speeds.
2:Sample Selection and Data Sources
CIGS precursor solution was prepared and spin-coated onto FTO substrates at different speeds. Perovskite precursor solution was then spin-coated onto the CIGS films.
3:List of Experimental Equipment and Materials
Materials included CuCl, InCl3, GaCl3, thiourea, DMSO, PbI2, CH3NH3I, PC61BM, ZrAcac, and Ag. Equipment included a spin coater, solar simulator, UV/Vis/NIR spectrophotometer, fluorescence spectrophotometer, SEM, UPS, XRD, and AFM.
4:Experimental Procedures and Operational Workflow
CIGS films were prepared by spin-coating precursor solution on FTO substrates at varying speeds, followed by heating. Perovskite layers were then deposited, followed by PCBM, ZrAcac, and Ag electrodes.
5:Data Analysis Methods
Device performance was characterized using J-V curves, EQE spectra, absorption and transmission spectra, PL and TRPL spectra, SEM images, UPS, and XRD patterns.
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Fluorescence spectrophotometer
FS5
Edinburgh Instruments
Recording room temperature photoluminescence (PL) and time-resolved PL spectra
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SEM
MERLIN
Carl Zeiss AG
Characterizing top-view and cross-section scanning electron microscopy images
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Focused ion beam
FEI Helios Nanolab 600i
FEI
Preparing cross-section SEM
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X-ray diffractometer
Bruker D8
Bruker
Recording X-ray diffraction (XRD) patterns
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Keithley 2400 sourcemeter
2400
Keithley
Recording J-V curves
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UV/Vis/NIR Spectrophotometer
LAMBDA 950
PerkinElmer
Recording absorption and transmission spectra
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Newport solar simulator
Newport
Providing simulated solar illumination
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UPS
AXIS Ultra DLD
KRATOS Analytical
Measuring the work function of FTO with or without CIGS films
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AFM
MFP-3D-Stand Alone
Asylum Research
Investigating the film surface morphology
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